- Title
- Synthesis and characterization of SHS bonded Ti₅Si₃ on Ti substrates
- Creator
- Riley, D. P.
- Relation
- Intermetallics Vol. 14, Issue 7, p. 770-775
- Publisher Link
- http://dx.doi.org/10.1016/j.intermet.2005.11.009
- Publisher
- Elsevier Ltd.
- Resource Type
- journal article
- Date
- 2006
- Description
- The simultaneous synthesis and bonding of titanium silicide, Ti₅Si₃, to pure Ti has been investigated using self-propagating high-temperature synthesis (SHS). Ti and Si reactants were ignited in a self-sustaining reaction, liberating sufficient heat to first synthesize then bond Ti₅Si₃ to a Ti substrate. Scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) were used to characterize the bond interface, while phase identification was performed using X-ray diffraction (XRD). The bond interface was shown to contain a uniform and continuous eutectic region, approximately 75 μm thick. Using back-scattered electron (BSE) imaging and quantitative phase analysis (QPA), the coating overlay was shown to consist of a two-phase mixture of 97 wt% Ti₅Si₃ with 3 wt% Ti segregated to the silicide grain-boundaries. It is proposed that the overall reaction sequence was initiated by the rapid SHS reaction, 5Ti + 3Si → Ti₅Si₃ + ΔHf = -579 Kj/mol prior to a secondary reaction with the Ti substrate in which the eutectic region was formed.
- Subject
- titanium silicides; bonding; coatings, intermetallic and otherwise; reaction synthesis; diffraction
- Identifier
- http://hdl.handle.net/1959.13/33978
- Identifier
- uon:3435
- Identifier
- ISSN:0966-9795
- Language
- eng
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